SRM 640f, Silicon powder (Nist, USA) $r $nSRM 640f - Silicon powder is intended to be used as a standard for calibrating the position and shape of diffraction lines determined by powder diffraction method. A SRM 640f unit consists of approximately 7.5 grams of silicon powder loaded under argon gas. Material Description: SRM is made of ultra-high purity intrinsic silicon rods, which are crushed and jet milled to a median particle size of 4.1 μ m. Then, the obtained powder was immersed in argon gas at 1000 #176; Annealing under C for 2 hours [1], and bottling under argon gas
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SRM 640f Silicon Powder (Standard for Line Position and Shape of Powder Diffraction)
英文名称: SRM 640f - Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder)
Specification: 7.5g/bottle

SRM 640f - Silicon PowderIntended as a standard for calibrating diffraction line positions and lines determined by powder diffraction method. A SRM 640f unit consists of approximately 7.5 grams of silicon powder loaded under argon gas.
Material Description: SRM is made of ultra-high purity intrinsic silicon rods, which are crushed and jet milled to a median particle size of 4.1 μ m. Then, the obtained powder was annealed at 1000 ° C for 2 hours in argon gas [1] and bottled under argon gas. The analysis of X-ray powder diffraction data shows that SRM materials have uniform diffraction characteristics.
Certified value: Certified lattice parameter at temperature
22.5 ° C at 0.543 114 4 nm ± 0.000008 nm
The interval defined by this value and its extended uncertainty (k=2) is mainly determined by the B-class uncertainty estimated based on technical understanding of the measurement data and its distribution. The NIST certification value refers to the value that NIST has confidence in its accuracy, as all known or suspected sources of bias have been investigated or considered. The certification value and uncertainty are calculated according to the methods described in ISO/JCGM guidelines [2]. The measured object is a lattice parameter. Metrological traceability is expressed in units of length, measured in nanometers.