Ultrasonic flaw detector phased array probe

Olympus​Ultrasonic flaw detectorPhased array probe 7.5CCEV35-A15 5CCEV35-A15

Characteristics:

●Acoustically, it can be compared withRexoliteMatch.
●The use of a thin phased array probe that can optimize focusing on the secondary axis has improved the ability to detect small defects on thin-walled pipe fittings.
●The detectable outer diameter is within21Millimeters~114Standard fittings within the millimeter range.
●Can be located at a distance from the tested pipe fittings12Operate in a narrow space of millimeters (for all standard fittings).
●COBRATwo more phased array probes can be installed on the scanner, so it can cover the weld seam in a single scan.
●After configuration, single-sided detection can be performed to evaluate the welding position between straight pipes and fittings.
●The scanner can be conveniently installed and operated from one side of the straight pipe.
●Can be combined with various wedges to complete most angle beam detection applications.

Typical Applications

A15probe
Thin walled applications
●Inspection of welds on small diameter pipe fittings
●Boiler pipe fittings
●Low rise space
●Process pipe fittings

Introduction to phased array technology
The distinguishing feature of phased array ultrasonic testing from other technologies is that it can excite a single chip in a multi chip probe through computer control (amplitude and delay). By exciting multiple piezoelectric composite material chips through software, a focused ultrasonic beam can be generated by dynamically changing the parameters of the beam, such as angle, focal length, and focal size, during the emission process. To generate a sound beam through active interference in phase, multiple active chips of the probe need to be triggered with minimal time difference. Similarly, the echo reflected from the expected focal point will touch different chips of the probe with a computable time offset. Before summarizing the echo signals received by each chip, it is necessary to perform time offset calculations on these echo signals. The summary result is to generate an A-scan, which highlights the response signal from the desired focus and weakens the signal from other parts of the tested sample.

Use software to control the angle, focal length, and focal size of the sound beam

To generate an ultrasound beam, it is necessary to probe at very different times with minimal differences
Pulse excitation is performed on different chips of the head. By controlling the time delay between probe chips, sound beams with different angles, focal lengths, and focal sizes can be generated. The echo reflected from the expected focal point will touch different chips of the probe with a computable time offset. Before summarizing the echo signals received by each chip, it is necessary to perform time offset calculations on these echo signals. The result of signal aggregation is to generate an A-scan. This A-scan will highlight the response signal from the desired focus and weaken various echoes from other parts of the material.

Multi angle detection can be achieved using a single, compact polycrystalline probe controlled electronically

Conventional UT testing requires the use of multiple different probes. A single phased array (PA) probe can be configured according to application requirements to generate different angles and focal points in a sequential manner.
Complete high-speed scanning without moving parts
Although phased array technology processes many signals from multi chip probes, it is important to note that the resulting signal is a standard radio frequency (RF) signal (or A-scan) that is identical to any conventional system using a fixed angle probe. This signal, like any A-scan from a conventional UT system, can be evaluated, processed, filtered, and an image generated. The B-scan, C-scan, and D-scan created based on A-scan are also similar to the images generated by conventional systems. The difference between them is that phased array systems can use a single probe to complete multi angle detection. Multi channel transmission can also complete scanning without moving the probe: focusing the sound beam
Created from several chips of a long-range array probe containing many chips. Then the sound beam is moved (or multiplexed) to other chips to perform high-speed scanning of the workpiece along the scanning axis without moving the probe. This way, the probe can perform more than one scan at different detection angles. This principle can be applied to the detection of planar workpieces using linear phased array probes, as well as to the detection of pipes and bars using circular phased array probes.

Olympus​Ultrasonic flaw detectorPhased array probe 7.5CCEV35-A15 5CCEV35-A15