Tektronix digital sampling oscilloscope

Tektronix digital sampling oscilloscope

Characteristics:

Electrical module signal measurement accuracy:

• Ultra low system jitter (<100 fs, typical value)
• > 70GHz

Achieve lower system noise in the industry across all bandwidths:

• High value 600 µ V (typical value 450 µ V) @ 60 GHz
• High value 380 µ V (typical value 280 µ V) @ 30 GHz

Multiple channels within a single host simultaneously collect<100 fs jitter.

The optical module supports optical consistency testing for all standard Ethernet rates from 155 Mb/s to 100 Gb/s (4x25).

Excellent collection throughput, with a sampling rate of up to 300 kS/s.

Can place the sampler near the device under test (DUT).

Independent calibrated channel phase difference correction.

Tektronix digital sampling oscilloscope advantage：

<100 fs background jitter allows for calibration of high bit rate (40 and 100 (4'25) Gb/s) devices, with typical<5% signal unit intervals used by testing instruments. The 70 GHz bandwidth allows for complete calibration of high bit rate signals (5th harmonic at data rate of 28 Gb/s and 3rd harmonic at data rate>45 Gb/s).

Greatly reduce the noise level of the instrument when collecting high bit rate and low amplitude signals, and avoid other noises that may cause additional jitter and eye closure.

High fidelity acquisition of multiple differential channels can be used for inter channel damage testing, improving the testing throughput of multiple high-speed serial channel systems.

Provide cost-effective and versatile optical testing systems for single-mode and multi-mode optical standards, ranging from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, - LR4, and ER4), with wavelengths of 850, 1310, and 1550nm.

By achieving excellent system throughput, manufacturing or equipment calibration testing time can be reduced by four times.

The remote sampling head significantly reduces signal degradation caused by cables and fixtures between the DUT and the instrument, simplifying the reverse embedding of the testing system.

The dual channel module has integrated calibrated channel phase difference correction to eliminate time delay and enhance the signal fidelity of multi-channel measurements.