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Imported metallographic microscope

NegotiableUpdate on 01/21
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Overview

BXFM Small System Microscope Detailed Introduction: Flexibility of Sample Size Compatible with ESD: Protecting Electronic Devices from the Effects of Electrostatic Discharge New 150 amp; #215; The 100mm stage provides a larger stroke in the X direction than previous models. In addition, the flat plate design of its loading platform allows for easy placement of large or multiple samples on the loading platform.

Product Details

BXFM Small System Imported Metallographic Microscope Detailed Introduction:

Imported metallographic microscopeThe flexibility of sample size is compatible with ESD: protecting electronic devices from electrostatic discharge, the new 150 × 100mm stage provides a larger stroke in the X direction than previous models. In addition, the flat plate design of its loading platform allows for easy placement of large or multiple samples on the loading platform. There are small holes on the loading platform that can be used to fix the sample holder. A larger stage provides users with flexibility, allowing them to examine more samples on one microscope, thereby saving valuable laboratory space. The adjustable torque stage facilitates fine adjustment and positioning of narrow field of view at high magnification. The optional module components can be used to place samples with a maximum height of 105mm on the stage
Up there. Due to the improved focusing mechanism, the microscope can accommodate a total weight of up to 6kg (sample+stage). This means that BX3M can inspect larger and heavier samples, thereby reducing the number of microscopes required in the laboratory. By strategically placing the rotating bracket for 6-inch wafers at an off center position, users can observe the entire wafer surface by simply rotating the wafer bracket while moving within a 100mm travel range. Optimized the torque adjustment of the stage for ease of use, and the comfortable handle makes it easier for users to find the area of interest of the sample. If the sample is too large to be placed on a conventional microscope stage, the core optical components used for reflective light microscope observation can be assembled into a modular system. This modular system, BXFM, can be installed on a larger bracket through a support rod or on another instrument using a mounting bracket. This allows users to fully utilize the advantages of Olympus' excellent optical components, even if their samples are very large in size or shape.
The vivid image observed by the UIS2 objective lens
Observing image examples


Clear field observation

Dark field observation

Differential interference observation

Observing through light


Rich product lineup, available for on-demand selection
MPLAPON flat field apochromatic lens
MPLFLN flat field semi complex achromatic lensMPLFLN-BD flat field semi complex achromatic lens for bright and dark field of viewMPLFLN-BDP flat field half complex achromatic lens for reflecting polarized lightLMPLFLN long working distance flat field semi complex achromatic lens
LMPLFLN-BD light dark field with long working distance flat field semi complex achromatic lensMPLN flat field achromatic lensMPLN-BD flat field achromatic lens for bright and dark fields of viewSLMPLN ultra long working distance flat field achromatic lensLCPLFLN-LCD liquid crystal long working distance flat field half complex achromatic lensRich attachments meet inspection requirementsDirectly switchable electric objective lens converter

Equipped with a manual switch to directly switch the required objective lens in an electric objective lens converter. Improved observation efficiency and prevented dust from falling onto the sample.


Electric objective lens converter

Schematic diagram of electric objective lens converter

*Concentric center correction objective lens converter

In order to achieve the same concentricity among the three objective lenses, a center correction 7-hole objective lens converter with two center correction mechanisms is equipped. Even if the objective lens is changed from low magnification to high magnification, the center of the image will not shift, improving inspection efficiency.


U-P5BDRE

U-P6RE

Lighting systems corresponding to various light sources

Corresponding to mercury and xenon light sources, an APO lighting system is configured, which corrects the color difference from visible light to near-infrared. Please select the lighting system as needed.


Light source lightbox

Fiber optic lighting

Using a digital camera can record and save digital images

The three eyed observation tube can be connected to a digital camera. It can save and record digital images to help create inspection reports. You can choose the desired digital camera from aspects such as image quality, functionality, and operability.

Small System Microscope BXFM Specification
optical system UIS2 optical system (infinite correction)
fuselage Observation method Bright field/dark field/differential interference/simple polarized light/fluorescence
Reflection/Transmission reflection
lighting device Light dark field of view reflective lighting device (bright field of view/dark field of view/differential interference/simple polarized light)
Universal reflective lighting device (bright field/dark field/differential interference/simple polarized light/fluorescence)
lighting system 反射照明 100 W halogen/100 W mercury/75 W xenon/fiber optic
Transmissive illumination -
Focusing unit Electric/manual manual
itinerary 30 mm
Resolution/Fine tuning sensitivity Rotate the fine-tuning knob once and move it 0.2 mm
Maximum sample height -
objective turret Electric type Clear field differential interference with 6 holes
Differential interference of light and dark fields of view with 5 holes
Correction of differential interference center in bright and dark fields of view with 5 holes
Light dark field differential interference with 6 holes
manual Mingshi Field 5 Holes
Clear field differential interference with 6 holes
Correction of differential interference center in bright field with 6 holes
Clear field differential interference with 7 holes
Light and dark field of view with 5 holes
Differential interference of light and dark fields of view with 5 holes
Correction of differential interference center in bright and dark fields of view with 5 holes
Light dark field differential interference with 6 holes
stage itinerary -
observation tube Wide angle field of view (22 fields of view) invert Binocular/trinocular/tilted binocular observation tube
Just like Three eye/tilted binocular observation tube
Ultra wide field of view (26.5 fields of view) invert Three eyed observation tube
Just like Three eye/tilted three eye observation tube
Attachment Unit -
Overall dimensions 248 (W) × 587 (D) × 249 (H) mm (standard combination)
weight 9 kg (standard combination)