Hitachi's new high-resolution field emission scanning electron microscope SU8000 series

Hitachi's new high-resolution field emission scanning electron microscope SU8000 series - SU8010

Product Introduction

Hitachi launched the S-4800 high-resolution field emission scanning electron microscope in China in 2005, which received high praise from users from all walks of life due to its excellent application performance, good stability, and easy maintenance.

In 2011, Hitachi launched its successor model - SU8010, which inherited the advantages of S-4800 and further improved its performance. After using the deceleration function at 1kv, the resolution was increased to 1.3nm. Compared with S-4800, it can present high-resolution images at lower acceleration voltages, significantly improving the observation effect of low atomic number samples that were previously difficult to observe.

Hitachi's new high-resolution field emission scanning electron microscope SU8000 series - SU8010 features:

1. Excellent low acceleration voltage imaging capability, with a resolution of up to 1.3nm at 1kv

2. Hitachi's ExB design does not require spray coating and allows for direct observation of non-conductive samples

3. The upper probe can choose to accept secondary electron images or backscattered electron images

4. The deceleration function can be turned on or off according to the sample type and observation requirements

5. Equipped with cold fingers and built-in heaters for the electron gun as standard, the objective aperture has self-cleaning function

6. The baking maintenance of the instrument and the mechanical alignment of the lens after baking can be completed by the user themselves

SU8010 Technical Parameters:

SU8010 application areas:

1. Nanomaterials;

2. Semiconductor devices;

3. Polymer materials;

4. Biomedical;

5. New energy.