Hitachi Field Emission Transmission Electron Microscope HF-3300

NegotiableUpdate on 03/18

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Overview

The Hitachi Field Emission Transmission Electron Microscope HF-3300, combined with Hitachi's renowned cold field emission electron gun and 300kV high-voltage system, ensures that HF-3300 has ultra-high resolution imaging and high-sensitivity analysis capabilities. HF-3300 has the dual prism holographic photography function of *, which can obtain many information that cannot be obtained by transmission electron microscopy, especially phase information related to the physical properties of the material (such as potential field, magnetic field, etc.). Combined with elemental electron energy loss spectroscopy (EELS) and high-precision parallel nanobeam diffraction techniques, HF-3300 can also be used to study ultra-high spatial resolution

Product Details

Hitachi Field Emission Transmission Electron Microscope HF-3300

Product Introduction:

HF-3300 is a 300kV cold field emission transmission electron microscope. The combination of Hitachi's renowned cold field emission electron gun and 300kV high-voltage system ensures that HF-3300 has ultra-high resolution imaging and high-sensitivity analysis capabilities. HF-3300 has the dual prism holographic photography function of *, which can obtain many information that cannot be obtained by transmission electron microscopy, especially phase information related to the physical properties of the material (such as potential field, magnetic field, etc.). Combined with elemental electron energy loss spectroscopy (EELS) and high-precision parallel nanobeam diffraction technology, HF-3300 can also study ultra-high spatial resolution elemental analysis and material structural characteristics, opening a new door for material research.

The main features of Hitachi Field Emission Transmission Electron Microscope HF-3300 are:

High brightness field emission electron gun cold
The inherent high brightness and high energy resolution of cold field emission electron guns make nanoscale analysis and research possible, making significant contributions to ultra-high resolution imaging and electron holography.

300kV High Voltage System

The 300kV high-voltage system has higher penetration capability, ensuring atomic resolution images of thick samples and reducing the difficulty of sample preparation, especially for the observation of high atomic number samples such as metals and ceramics.

*Analytical ability
New analytical techniques have been introduced, including dual prism holography, high spatial resolution electron energy loss spectroscopy (EELS), and high-precision parallel nanobeam diffraction technology.

Can be used in conjunction with FIB sample rod
Hitachi's proprietary sample rod can adapt to the use of FIB, TEM, and STEM.

Easy to use control system
The computer control system developed based on Windows, motor-driven movable aperture, and 5-axis motor sample stage make the instrument simple and easy to use. The 10 minute boost time and 1-minute sample change time ensure the efficient operation of the instrument.

Technical Specifications:

project	Main parameters
electron gun	Single crystal tungsten (310) cold field emission electron gun
accelerating voltage	300kV、200kV^、100kV^
Point resolution	0.19nm
Line resolution	0.10nm
Information resolution	0.13nm
magnification	Low magnification: 200x -500x; Observation: 2000x -1500000x
Image rotation	≤± 5 ° (observation mode, below 1000000x)
Sample tilt	±15°
Camera length	300 – 3,000 mm
Spectral solid angle^*	0.15Sr

Application fields:

As a high-voltage transmission electron microscope with cold field emission, HF3300 can be used as a high-resolution observation device for most material samples (metals, ceramics, etc.), which can simplify the difficulty of sample preparation and ensure high resolution. At the same time, HF-3300 can also meet the needs of high spatial resolution analysis. The high brightness and low color difference cold field emission electron gun provides a guarantee for high spatial resolution element and structural analysis. Combined with EELS and nano beam diffraction functions, it can achieve the study of the distribution and crystal structure of nanoscale elements. *The dual prism holographic imaging function of HF-3300 enables it to obtain more information about the sample, especially information related to physical properties, greatly expanding its application fields.