Hitachi High Tech Field Emission Scanning Electron Microscope SU8200 Series

Hitachi's new field emission scanning electron microscope SU8200 series (SU8220, SU8230, SU8240)

Instrument Introduction:

The SU8200 series cold field scanning is a new generation of innovative cold field electron microscope developed by Hitachi High Tech after years of dedicated research and huge investment,It not only inherits all the advantages of previous cold field emission scanning electron microscopes, but also significantly increases the probe current and enhances the stability of the current. These advantages enable high-resolution observation and analysis functions to be continuously achieved for a long time under low acceleration voltage.This series of scanning electron microscopes not only inherits all the advantages of previous cold field emission scanning electron microscopes, but also significantly increases the probe current, enhances the stability of the current, and avoids the waiting time for image acquisition after filament Flash. It can be said that it makes up for all the weaknesses of previous cold field electron microscopes and becomes a true ultra-high resolution analytical cold field scanning electron microscope, staging a real-life version of the return!

The main features of Hitachi High Tech Field Emission Scanning Electron Microscope SU8200 series are:

Hitachi's newly developed cold field electron gun

1. Utilize the high brightness stable period after electron gun bombardment, with a larger and more stable beam current, and balance high-resolution observation and analysis

2. Significantly improve resolution (1.1nm/1kV, 0.8nm/15kV)

3. High vacuum sample chamber for reducing pollution

4. Visualize the contrast of multiple materials through the top filter (optional)

Technical parameters of Hitachi High tech Field Emission Scanning Electron Microscope SU8200 series:

Application fields:

1. Nanomaterials;

2. Semiconductor devices;

3. Polymer materials;

4. Biomedical;

5. New energy;

Sample: mesoporous silica nanospheres; Landing voltage: 500 V

Sample: Kaolin; Landing voltage: 50V

Sample: Au/Cu2O core-shell nanocubes; EDX spectrum conditions: 5 kV, 0.7 nA, 15 min, 150000 ×

(Top filter off) (Top filter on)

Sample: Positive electrode material for lithium-ion batteries (same observation field); Observation condition: 1KV