Hitachi Desktop Electron Microscope TM3030

Hitachi Desktop Electron Microscope TM3030

Product Introduction

The Hitachi TM3030 desktop electron microscope has a compact structure and is easy to operate. The operator does not need professional knowledge of electron microscopy and has no special requirements for the operating environment. Equipped with a large sample warehouse, the largest sample size is D=70mm, H=50mm. Equipped with standard mode and low vacuum charge suppression mode, it can achieve direct observation of non-conductive samples. Equipped with a new electronic optical system and a 4-section high-sensitivity backscattered electron probe, it can image samples in multiple modes. The optional accessories are abundant and have many additional functions.

Product Features:

Equipped with a standard 4-segment backscatter detector, it can collect image information from four different directions and has four imaging modes. The magnification can reach 60000 times, and the digital magnification can reach 240000 times Standard sample compartment, capable of accommodating the largest sample with a diameter of 70mm and a thickness of 50mm.

The low vacuum function of TM3030 * enables rapid observation of samples without any processing. The compact design means that the TM3030 can be easily installed and operated in offices and other places. By optimizing the electronic optical system, TM3030 also provides a "5kV mode", allowing the surface structure of the sample to be observed without the need for high acceleration voltage.

TM3030Plus adds a high-sensitivity low vacuum secondary electronic probe UVD on the basis of TM3030. This probe has good imaging quality in low vacuum environments and does not require sample pretreatment.

TM3030Plus can superimpose secondary electron images and backscattered electron images into one image and display it in real-time. The secondary electron image mainly presents high-resolution surface morphology information of the sample, while the backscattered electron image mainly presents component contrast information.

Main parameters:

1. Magnification: × 15~60000

2. Set observation conditions: 5KV/15KV/EDX

3. Observation modes: Standard mode, Reduced charge mode

4. Detector: High sensitivity semiconductor four segment BSE detector

5. Electron gun: pre aligned filament

Application fields:

Life Sciences

Materials Science

chemistry

electronics manufacturing

food industry