This product can easily obtain highly sensitive, high-definition, and high-resolution scanned images through a variety of applications. Through excellent speed and precision, we drive your research and development progress and assist you in making new scientific discoveries——FX40 fully utilizes artificial intelligence, and the fully automated process can meet the needs of users for nanoscale microscopes. Additional axial automatic laser calibration, early warning and fault automatic safety system, synchronized information extraction and storage allow even untrained research scientists in atomic force microscopy to easily and quickly obtain desired scanning results.

High configuration safety factor

Safe probe landing device——Comprehensive protection of samples and probes

ParkThe combination of anti-collision sensor devices and interlocking software can better protect the needle tip andAFMScanner. Through algorithm programming,ZThe mobile station can only lift and lower within the limit of collision between the needle tip and the sample surface, avoiding damage caused by probe sample collision, greatly improving productivity and measurement accuracy.

Self diagnostic environmental sensor

The intelligent scanner displays and stores the measurement results of the sensors. Sensors mainly measure basic environmental conditions such as temperature, humidity, level, and vibration. This helps users scan images under different environmental conditions and filter suitable environmental indicators for you.

Safe probe installation system

Users can choose between manual or automatic probe installation functions, and the built-in intelligent system will automatically detect and issue warnings when users install probes incorrectly, effectively improving measurement accuracy.

Park FX40technical parameter

XY scanner
structure

▪ Single module parallel two-dimensional flexible scanner
▪ Better symmetry than flexible scanners

XY scanning range

▪ 100 µm x 100 µm

Z scanner
structure

▪ Flexible guided strong scanner
▪ Better symmetry than flexible scanners

Z-scan range

▪ 15 µm

Loading samples
load

▪ Magnetic suction cup, capable of holding up to 4 sample slides
▪ FX Multi functional Embedded Sample Stand

Drive table
Z displacement table travel range

▪ 22 mm (Mobile)

view
view

▪ Sample coaxial field of view
▪ The same view as an optical microscope

CCD

▪ 5.1 million pixels
▪ Pixel size: 3.45 μ m x 3.45 μ m

Atomic force microscope controller
Lock-in amplifier

▪ 4-channel integrated 16Hz-5MHz

parts
Automatic needle change

▪ Automatic needle changing technology can be used to replace needles in less than a minute

Loading probes

▪ Loading with probe carrier