Transmission Electron Microscope Talos F200X S/TEM

Thermo ScientificTM TalosTM F200X S/TEM provides fast and accurate multi-scale characterization of nanomaterials, equipped with multiple functions to improve efficiency, accuracy, and usability, making it an ideal choice for research and analysis in academic, government, and industrial fields.

High resolution imaging to obtain high-quality data
The Talos F200X S/TEM combines excellent high-resolution STEM and TEM imaging capabilities, energy dispersive spectroscopy (EDS) signal detection capabilities, and three-dimensional chemical characterization based on compositional surface analysis. The Thermo Scientific Velox TM S/TEM control software significantly improves the quality of S/TEM imaging through an intelligent scanning engine, multi-channel merging technology based on multiple STEM detectors, and differential phase contrast (DPC) imaging technology. It can analyze electromagnetic structures and perform fast and accurate EDS data processing and quantitative analysis.

The X-FEG high brightness electron gun can provide up to five times the brightness of a standard Schottky field emission electron gun while maintaining a small convergence angle. Users can obtain high signal-to-noise ratio, STEM, EDS image resolution, and more high-resolution TEM applications. The high stability and long service life of X-FEG high brightness electron gun make it have higher imaging efficiency.

Larger field of view, faster speed

Talos fast D/TEM imaging supports high-resolution and in situ dynamic imaging. The Thermo Scientific Ceta 16M TM camera has a larger field of view and an image acquisition resolution of up to 25 frames per second. At the same time, the piezoelectric sample stage ensures high sensitivity, drift free imaging, and accurate sample navigation, saving time and allowing users to collect more sample data.

Accelerate nanoscale analysis to obtain answers faster

The Talos F200X S/TEM adopts Thermo Fisher's Super XTM integrated EDS system and is equipped with four silicon drift X-ray detectors, which have extremely high sensitivity and can collect up to 105 spectra per second. The integration of X-TWIN objective lens improves the efficiency of X-ray collection while achieving the ideal output count rate under a given beam current (even low-intensity EDS signal).

Conduct research more easily
Talos S/TEM adopts a user-friendly digital user interface and ergonomic design, allowing multiple scientists to access imaging and analysis workflows. Combining fast image acquisition with a simple and easy-to-use operating platform, even inexperienced operators can quickly collect results. The remote operation design of human-machine separation significantly improves usability, comfort, and stability of electron microscopy. In addition, to ensure the maintenance of work efficiency, Talos S/TEM is equipped with new equipment status recording and diagnostic software to collect important instrument parameters for remote diagnosis and support.

X-FEG 亮度 1.8 × 109 A/cm2 srad(@200 kV)
Total electron beam current>50 nA
Probe current 1.5 nA @ 1 nm beam spot (200 kV)
The Super-X EDS system adopts a symmetrically designed SDD energy spectrum probe, windowless design, and shield protection
Energy resolution ≤ 136 eV Mn-K α @ 10 kcps (output)
Fast EDS surface analysis with pixel dwell time as short as 10 μ s
STEM HAADF resolution 0.16 nm
EDX solid angle 0.9 srad
TEM information resolution of 0.12 nm
The maximum diffraction angle is 24 Moh
The maximum tilt angle of the double tilt sample rod is ± 35 ° α tilt angle/± 30 ° β tilt angle
The sample stage has a maximum tilt angle of ± 90 degrees

Optical performance: constant power A-TWIN objective lens
Usability: Fast and easy operation switching, suitable for multi-user environments
Ultra stable platform: constant power objective lens, piezoelectric sample stage, reliable system housing, and remote operation ensure stability
SmartCam camera: The digital search and view camera significantly improves the processing power of all applications, allowing users to remotely operate from the darkroom.
Fully integrated fast camera: The Ceta 16M pixel CMOS camera provides a large field of view and high read speed (25 fps at 512 x 512)
Comprehensive remote operation: The combination of automatic aperture system and Ceta camera supports comprehensive remote operation
Rich analysis capabilities: Talos S/TEM uses EDS 3D imaging technology to extend the sample composition analysis capability from 2D to 3D.