Total Reflection X-ray Fluorescence Spectrometer

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Overview

Product Name: Total Reflection X-ray Fluorescence Spectrometer Product Model: TX 2000 Update Time: June 30, 2023 Brand: GNR Production Address: Italy TXRF (Total Reflection X-ray Fluorescence/Total Reflection X-ray) Analysis principle is based on X-ray fluorescence spectroscopy, but in contrast to X-ray spectroscopy, traditional spectroscopy uses a primary X-ray beam to bombard the sample at a 45 degree angle, while TXRF uses a critical angle of milliradians (close to zero degree angle) for incidence. Due to the use of this nearly tangential incident angle, almost all of the primary X-ray beam can be reflected. When irradiated on the surface of the sample, it can greatly avoid the absorption of the beam by the sample carrier and reduce the occurrence of scattering. At the same time, it reduces the background and noise of the carrier and can also reduce the amount of sample used.

Product Details

　　Application range of total reflection X-ray fluorescence spectrometer

The principle of TXRF (total reflection X-ray fluorescence) analysis is based on X-ray fluorescence spectroscopy, but in contrast to X-ray spectroscopy, traditional spectroscopy uses a primary X-ray beam to bombard the sample at a 45 ° angle, while TXRF uses a critical angle of milliradians (close to zero degrees) for incidence. Due to the use of this nearly tangential incident angle, almost all of the primary X-ray beam can be reflected. When irradiated on the surface of the sample, it can greatly avoid the absorption of the beam by the sample carrier and reduce the occurrence of scattering. At the same time, it reduces the background and noise of the carrier and can also reduce the amount of sample used.

TX2000 integrates total reflection and traditional energy dispersion on the same instrument, with an innovative optical encoder stepper motor, angle measurement, software controlled Mo/W target that can be freely switched, and a high-resolution, low background Peltier temperature controlled silicon drift detector.

　　Application scope

TX2000 can detect the content of all elements from sodium Na to plutonium Pu, and can perform trace or ultra trace element analysis (ppt or pg). It is widely used in environmental analysis (water, dust, sediment, atmospheric suspension), pharmaceutical analysis (harmful elements in biological fluids and tissue samples), forensic science (small evidence analysis), chemical purity analysis (acid, alkali, salt, solvent, water, ultra pure reagents), oil analysis (crude oil, light oil, fuel oil), dye analysis (ink, paint, powder), semiconductor material analysis (volatile phase decomposition), nuclear material industry (radioactive element analysis).

　　main features

1. Single internal standard calibration effectively simplifies quantitative analysis without matrix influence;

2. Samples of any matrix can be calibrated and quantitatively analyzed separately;

3. Multi element real-time analysis, capable of trace and ultra trace analysis;

4. Not affected by the type of sample and different application requirements;

5. The microanalysis of liquid or solid samples requires a small amount of sample for analysis;

6. Excellent detection limit level, with elemental analysis ranging from sodium coverage to plutonium;

7. Dynamic linear range;

8. No chemical pretreatment required, no memory effect;

9. Non destructive analysis with low operating costs.

According to different spectroscopic systems, XRF spectrometers mainly have two types: wavelength dispersive (WDXRF) and energy dispersive (EDXRF). The schematic structures of the two are shown in the following figure:

Compared with the wavelength dispersive spectrometer (WXRF) method within the range of X-ray fluorescence spectrometer, TXRF analysis technology requires a small sample size, does not require the tedious process of sample preparation, and does not have background enhancement or attenuation effects. Therefore, it does not require different matrix calibration curves to be made for different matrices each time. In addition, due to the use of internal standard method, the requirements for environmental temperature and other factors are very low. Therefore, it has significant advantages over the WXRF method in terms of simplicity, economy, and small sample size.

TXRF technology can analyze all elements from oxygen to uranium, and can simultaneously analyze nearly 30 elements at once, which is difficult to achieve with ETAAS and FAAS methods in atomic absorption spectrometers. Compared with methods such as ICP-MS, GDMS, and neutron activation analysis (NAA) in mass spectrometers, TXRF analysis has comprehensive advantages in terms of speed, simplicity, economy, simultaneous analysis of multiple elements, small sample size, low detection limit, and good quantitation.