Thin film thermal property tester

NegotiableUpdate on 03/28

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

This instrument is used to test the thermal properties of thin film materials. Thin film physics states that when an object is very thin, the physical properties of the same material in a thin film state and in a volumetric state are not necessarily the same. Therefore, the measurement of the physical properties of a thin film must be carried out in the thin film state. A transient experimental model based on the cosine (or sine) law of surface temperature variation of an object. The temperature wave method is used to test the thermal properties of thin film materials, as the thin film is a finite thickness dimensional model. In this state, when the temperature oscillation frequency reaches a constant value, the phase difference between the upper and lower surface temperatures of the sample is used to calculate the thermal conductivity or thermal conductivity. Instruments for studying thin film materials

Product Details

HCX09A Thin Film Thermal Property TesterMain technical parameters:

1. Thermal conductivity range: 0.05-20w/m · k

2. The instrument realizes digital temperature measurement with an accuracy better than 0.2 level.

3. Measurement results with an accuracy of ± 3%

4. The metering heating power can be adjusted by ± 1%.

5. Sample size requirement: Cylinder ￠ 15-30 * 5-30mm

6. Temperature and protective atmosphere are customized according to user requirements.

7. Connect to a computer to achieve fully automated testing and analysis.