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emkete@emcrafts.com.cn
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Building 25, No. 9 Anningzhuang West Road, Haidian District, Beijing
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- Food Quality Analyzer
- Terahertz time-domain spectrometer
- Ultra high resolution optical microscope
- Nanoindentation instrument
- electron microscope
- Electronic universal material testing machine
- atomic force microscope
- x-ray microscope
- optical microscope
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- Electron microscope sample preparation equipment
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Platinum (Beijing) Technology Co., Ltd
Terahertz time-domain spectrometer
NegotiableUpdate on 01/13
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Overview
Terahertz Time Domain Spectrometer 2018/12/13 Graphene and 2D Material Characterization Onyx is a system designed on the market to provide full area non-destructive characterization of graphene, thin films, and other 2D materials. Onyx fills the gap between macroscopic and nanoscale tools, and can detect features ranging from 0.5 mm2 to large areas (m2), thereby enhancing the industrialization level of research materials. Compared with other large-area testing methods such as the four probe method, Onyx is able to measure the spatial distribution of sample mass. Unlike microscopic methods such as Raman, SEM, and TEM, large-area samples can be rapidly characterized with a spatial resolution of hundreds of micrometers. The mobility and carrier density Onyx continuously improve its functionality to provide new results, greatly enhancing its potential. Onyx integrates mobility and carrier density analysis into its previous functionality. In just one measurement, the system can accurately provide the following physical properties: DC conductivity, σDC、 DC resistance, RDC、 Carrier scattering time, carrier mobility, μ drift
Product Details
Graphene and2Dmaterial characterization
OnyxIt is designed in the market to provide graphene, thin films, and other materials2DA system for non-destructive characterization of materials across the entire region.
OnyxFill the gap between macro tools and nano tools, which can detect0.5 mm2To a large area（m2）Enhance the industrialization level of research materials by identifying their characteristics. Compared with other large-scale testing methods such as the four probe method,OnyxCapable of measuring the spatial distribution of sample quality. Compared to microscopic methods such as Raman spectroscopy,SEMandTEM）Different, it can quickly characterize large-area samples with a spatial resolution of hundreds of micrometers.
Mobility and Carrier Density
OnyxContinuously improving its functionality to provide new results, thereby greatly enhancing its potential.OnyxIntegrate mobility and carrier density analysis into its previous functionality. In just one measurement, the system can accurately provide the following physical properties:DC conductivity, σDC、 DC resistance, RDC、 Carrier scattering time, carrier mobility, μ drift
