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Shanghai Mangofei Optical Technology Co., Ltd
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Shanghai Mangofei Optical Technology Co., Ltd

  • E-mail

    ganxiafen@megphy.com

  • Phone

    17706131531

  • Address

    Room 13, 6th Floor, Building B, Tengfei Xinsu Industrial Park, No. 5 Xinghan Street, Suzhou Industrial Park

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Surface profilometer manufacturer

NegotiableUpdate on 01/21
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Overview

Brief description: The surface profilometer is a Cartesian coordinate system. The X-axis is measured using our company's independently developed and produced precision motion guide rail as the straight line reference, and the high-precision imported grating ruler as the X-axis counting element

Product Details

Surface ProfilometerStructural characteristics:
The surface profilometer is a Cartesian coordinate system. The X-axis is measured using our company's independently developed and produced precision motion guide rail as the linear measurement reference, and the high-precision imported grating ruler as the X-axis counting element. Its counting accuracy and stability ensure the counting accuracy of the X-axis and provide sufficiently dense data for precision measurement (with a data acquisition interval of as small as 0.5 μ m).
The workbench and columns are made of natural granite material, which makes the mechanical performance of the instrument more stable, reliable, deformation free, and aesthetically pleasing.
The Z-axis adopts high-precision digital sensors, which have a large measurement range, high accuracy, and stability (only available in China). Its good linearity ensures the accuracy of the RC series profilometer while meeting the requirements of large range measurement. And the accuracy and stability in maintaining large range measurements make us in the industry.
★ Based on the Windows 7 operating system, Weir independently developed the RC series contour measurement software, which seamlessly integrates RC software with CAD software, and the operation mode is more convenient and clear compared to CAD *. Its core has the ability to make corrections, with no special requirements for the placement of workpieces, greatly reducing the adjustment time of workpieces, improving measurement efficiency, archiving measurement result databases, printing and outputting functions, etc.