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15921165535
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No. 418 Huajing Road, Shanzhong Science and Technology Park, Waigaoqiao Free Trade Zone, Pudong New Area, Shanghai
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Duzhi Instrument (Shanghai) Co., Ltd
Oxford CMI563 Copper Thickness Gauge, Oxford, UK
NegotiableUpdate on 02/15
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Overview
The Oxford Instruments CMI563 Surface Copper Thickness Gauge is designed specifically for measuring the thickness of copper foil on rigid and flexible, single-layer, double-layer, or multi-layer printed circuit boards. CMI563 uses micro resistance testing technology to provide a precise method for measuring surface copper thickness (including copper-clad laminates, chemical copper, and electroplated copper plates). Due to the use of advanced testing techniques currently available in the market, regardless of the thickness of the insulation layer, the copper layer on the back of the printed circuit board will not affect the accurate and reliable measurement results.
Product Details
product description
The Oxford Instruments CMI563 Surface Copper Thickness Gauge is designed specifically for measuring the thickness of copper foil on rigid and flexible, single-layer, double-layer, or multi-layer printed circuit boards. CMI563 uses micro resistance testing technology to provide a precise method for measuring surface copper thickness (including copper-clad laminates, chemical copper, and electroplated copper plates). Due to the use of advanced testing techniques currently available in the market, regardless of the thickness of the insulation layer, the copper layer on the back of the printed circuit board will not affect the accurate and reliable measurement results.
The innovative CM1563 copper foil thickness gauge is equipped with an SRP-4 probe that can be replaced by the user. Compared to replacing the entire probe, replacing the probe is more convenient and economical. CM1563 allows users to choose the type of copper foil to be tested, namely chemical copper or electroplated copper; Even without the need for user calibration, the linearity of copper foil can be measured. The calibration standard plates certified by NIST (National Institute of Standards and Technology) have different thicknesses to choose from. The high-quality CM1563 can also enjoy premium warranty services and full support from Oxford Instruments' global customer service system.
Micro resistance testing technology
Use four contact probes to generate electrical signals on the surface copper foil for measurement. The SRP-4 probe uses four specially designed, durable probes (Oxford Instruments products) to ensure high accuracy
Contact AreaAnd small measurement surface imprints. The probe can be seen through the transparent material casing, allowing customers to accurately locate the testing location. The probe is made of highly durable alloy to resist breakage and wear.
When the probe contacts the copper foil sample, a constant current passes through the outer two probes, while the inner two probes measure the change in voltage. According to Ohm's law, voltage values are converted into positive values,
Using a certain function，Calculate the thickness value. Micro resistance testing technology provides high-precision copper thickness measurement for copper foil applications.
The tethered SRP-4 probe uses sturdy and durable connecting wires for on-site operation. In addition, the small coverage area of the SP-4 probe makes it more convenient and user-friendly to use. The worn out probes can be quickly and easily replaced on site, reducing downtime to * *. Replacing the probe module is much more economical than replacing the entire probe. The standard configuration of CMI563 includes a replacement probe module. The probe modules ordered separately are grouped in groups of three.
Copper thickness measurement range:
Non electroplated copper: 10 μ in -500 μ in (0.25 μ m -12.7 μ m), Electroplated copper: 0.1 mil -6 mil (2.5 μ m -152 μ m) Linear copper can measure line width range: 8 mil -250 mil (203 μ m -6350 μ m)
SRP-4The probe adopts a user replaceable probe module
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Technical Parameter |
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accuracy |
Chemical Copper:standard deviation0.2%; COPPER PLATING:standard deviation0.5 % |
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resolution |
0.01mils >1mil,0.001mils <1mil,0.1pm> 10 μm,0.01μm < 10='' pm,0.001μm=''><>1mil,0.1pm> |
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Measuring thickness range |
Chemical Copper: 10 puin-500μin(0.25 μm-1 2.7μm), COPPER PLATING: 0.1mil to 6 mil (152 μm) Wide range of linear copper wire8 mil to 250 mil (203μm-6350μm) |
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storage capacity |
13500Strip reading |
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size |
5 7/8”(long) x 3 1/8”(wide) x 13/16'(tall) (14.9 x 7.94 x 3.02 cm) |
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weight |
9 Oz (0.26 kg)Including batteries |
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unit |
One click automatic conversion between imperial and metric systems |
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battery |
9Alkaline battery |
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BATTERY LIFE |
65Continuous use for hours |
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interface |
RS-232Serial interface, adjustable baud rate, used for downloading to a printer or computer |
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display |
digitLCDlcd,2Digital storage bit?Set, character height1/2inch( 1.27cm) |
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Statistics show that |
Number of measurements, standard deviation, mean, * large value, * small value. |
About Us
Duzhi Instrument (Shanghai) Co., Ltd. adheres to the principle of "Focus on Better Quality" and focuses on the research, introduction, and promotion of measurement, testing, and material analysis equipment. With a strong engineering and technical background and efficient resource integration, the company helps enterprises significantly improve efficiency and reliability in various aspects such as original design, development cycle, product quality, and in-service testing.
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