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Nanoindentation instrument

NegotiableUpdate on 01/13
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Overview
Nano indentation tester 2018/06/07 Basic parameter types/usage: In vacuum (SEM, partial vacuum, inert gas), in air Main indentation mode: True displacement testing protocol Adaptability: Customizable software upgrade options/extension functions: High temperature and ultra-high strain rate module indentation prompts: Berkovich, Cube Corner, Flattop, Wedge, Spherical, etc. Indentation range: 40 μ m Displacement noise floor: 1nm Load range: 500mN Standard/optional 1.5N Loading background noise: 4 μ N/12 μ N RMS noise Sinusoidal mode: 200Hz Displacement mode Indentation introduction: Operators can freely define any contour (displacement or load) Sample top alignment indenter tip Remote method: 22 mm Range, 1nm Resolution (Closed Loop) Automatic Approach Mode: Exceeding a few millimeters Sampling Position Range: 26 X26mm, 1nm resolution (closed loop) indentation area (recommended) 10x10mm room temperature drift: 5nm/min (in vacuum) ultra-high strain rate module strain rate: up to 3000s-1 sinus mode: open-loop 10kHz startup range: 1 μ m measurement range: 1N loading background noise: 30 μ N RMS noise high temperature module high temperature range: standard 600 ℃/optional 800 ℃ drift at 600 ℃: 10nm/min at 60 ℃
Product Details

basic parameters

Type/Usage: In vacuum (SEM, partial vacuum, inert gas), in air
Main indentation mode: true displacement
Adaptability of testing protocol: customizable software
Upgrade Options/Extended Features: High Temperature and Ultra High Strain Rate Modules


indentation
Indentation prompts: Berkovich, Cube Corner, Flattop, Wedge, Spherical, etc
Indentation range: 40 μ m
Displacement noise floor:<1nm
Load range: 500mN standard/optional 1.5N
Load background noise: 4 μ N/12 μ N RMS noise
Sinusoidal mode: 200Hz displacement mode
Introduction to indentation: Operators can freely define any contour (displacement or load)


Align the top of the sample
Remote method for pressure head tip: 22mm range, 1nm resolution (closed-loop)
Automatic approach mode: over a few millimeters
Sampling position range: 26x26mm, 1nm resolution (closed-loop)
Recommended indentation area: 10x10mm
Drift at room temperature: 5nm/min (in vacuum)


Ultra high strain rate module
Strain rate: up to 3000s-1
Sinusoidal mode: open-loop 10kHz
Start range: 1 μ m
Measurement range: 1N
Load background noise: 30 μ N RMS noise


High temperature module

High temperature range: Standard 600 ℃/optional 800 ℃
Drift at 600 ℃: 10nm/min
Stability time at 600 ℃:<3 hours
Head tip materials: diamond, cubic boron nitride, sapphire, tungsten carbide, etc
Temperature stability: 10mK resolution