Minolta desktop spectrophotometer

CM-3700A Minolta desktop spectrophotometerProduct Overview

Measurement of Reflected Color

• SCI or SCE measurement methods can be selected
  The measurement method of SCI (including specular reflection) can minimize the influence of sample surface conditions on measurement data, making it particularly suitable for color matching applications. The measurement method of SCE (excluding specular reflection) is closer to professional visual evaluation.
• Variable measurement area
  According to the needs, three measurement areas can be selected, with diameters of Ø 25.4 mm, Ø 8 mm, and 3 mm × 5 mm.
• Variable UV content
  When measuring samples containing fluorescent materials such as paper and pulp, you can control the UV component in the illumination light source to a fine level of 1000.

Measurement of transmittance color

• Transmission measurement cavity capable of measuring samples of any length (maximum thickness: approximately 50 mm)
  Suitable for d/0 geometric optical systems, it can measure the spectral transmittance of samples such as liquids, films, plastic sheets, etc.

Main purpose

Suitable for industries such as plastics, fibers, dyeing, ceramics, etc

CM-3700A Minolta desktop spectrophotometerMain features

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CM-3700A is computer-controlled.
Can be paired with SpetraMagic ™ NX software is used for control.

• Lighting/Receiving SystemD/8 (diffuse illumination, 8-degree reception) optical structure that complies with CIE, ISO, ASTM, DIN, and JIS, and transmission structure of CIE, ASTM, DIN, and JIS.
• Pulse xenon lamp light sourceHigh brightness, good stability, long lifespan, and repeatability in measuring dark and high saturation colors.
• 6-inch integral ballAdopting high-tech coatings with excellent optical properties, making lighting more uniform.
• Dual beam feedback systemBy monitoring and automatically compensating for the energy of the reflected light from the illumination source through sensors, measurement errors caused by changes in brightness or spectral characteristics can be reduced.
• Spectral element
  holographic gratingMore effectively distinguish light of different wavelengths, thus having better repeatability when measuring dark objects.
  Silicon photodiode sensor arrayIt can quickly convert optical signals into electrical signals. These components are installed on stainless steel with low thermal expansion index to ensure stability.
• The optical structure for sample measurement and light source monitoring is installed inaluminum alloy blockUp, it can also improve stability.

CM-3700AOther characteristics

Longer sample clamp arm, even capable of measuring the middle of A4 sized samples

The sample holder can be opened to facilitate the measurement of larger and thicker samples

Power protection bracket to prevent power outages caused by accidental contact

brand newUSB portEnsure convenient connection and high-speed data communication

CM-3700AMain specifications