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Shanghai Mangofei Optical Technology Co., Ltd

  • E-mail

    ganxiafen@megphy.com

  • Phone

    17706131531

  • Address

    Room 13, 6th Floor, Building B, Tengfei Xinsu Industrial Park, No. 5 Xinghan Street, Suzhou Industrial Park

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Mal's easy-to-use portable roughness measuring instrument

NegotiableUpdate on 01/21
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Overview

Brief description: The MarSurf M400 is a portable roughness measuring instrument that is easy to use. Mobile devices, measurement rooms, and production fields are increasingly in need of surface evaluation without block scanning. This usually requires more skilled operators, more time, and more adjustment work. The MarSurf M 400 provides necessary functionality within the range of 'mobile surface measurement', and is fast, easy to use.

Product Details

Origin category Import

MarSurf M400 is a convenient and easy-to-use portable roughness measuring instrument
The measurement room and production field increasingly require surface evaluation without block scanning.
This usually requires more skilled operators, more time, and more adjustment work.
The MarSurf M 400 provides the necessary functionality within the range of 'mobile surface measurement', and is fast, easy to use.

  • Mobile and fixed measuring instruments
  • Measurement of roughness and waviness
  • Scan length up to 26 mm
  • Surface parameters exceeding 50 R, W, and P
  • Automatically select cutoff and scan lengths based on standards
  • Dynamic calibration function
  • Optional wired and Bluetooth connection between the drive device and the evaluation instrument (4 meters)
  • Magnetic probe holder (independent probe) BFW 250
  • Mobile probe zeroing setting (7.5 mm)

Measurement principles

Probe method

input

BFW non-conductive block system

Measurement range mm

+/-250 µ m (up to+/-750 µ m, 3x measuring rod length)

Contour resolution

Measurement range+/-250 µ m: 8 nm
Measurement range+/-25 µ m: 0.8 nm

The filter complies with ISO/JIS standards

ISO 11562 standard Gaussian filtering
ISO 13565 standard filtering

The sampling length and quantity comply with ISO/JIS

1-5

Contact speed

0,2 mm/s; 1,0 mm/s

Measurement force (N)

0.75 mN

Weight driven unit

About 0.9 kg

Weight measuring instrument

About 1.0 kg

Surface parameters

More than 50 surface parameters that comply with current ISO/JIS or MOTIF (ISO 12085) standards are available for R -, P -, and W
contour