Jupiter XR Atomic Force Microscope

Jupiter XR Atomic Force Microscope 2022/04/01 Jupiter XR is an atomic force microscope suitable for large-sized samples. Through it, users can achieve high-speed imaging and large-scale scanning on one scanner. Jupiter atomic force microscope can be used for scanning 200mm wafer samples, providing higher resolution, faster measurement speed, simpler user experience, and excellent versatility in both academic research and industrial development fields. Compared with similar large sample atomic force microscopes, it has a higher resolution scanning range of up to 100 μ m, and its speed is 5-20 times faster than most atomic force microscopes. From setting up to obtaining results, each step is simpler and faster. Modular design is more flexible and can meet various needs