High resolution wavefront analyzer/wavefront sensor/wavefront phase difference meter

High resolution wavefront analyzer/wavefront sensor/wavefront phase difference meter

400X300high resolution500umHigh dynamic range, high cost-effectiveness, simultaneous detection of wavefront andM^2Wavefront sensor!

Keywords:Wavefront sensor, wavefront analyzer, wavefront aberration analyzer, sensor, wavefront testerwavefront sensorLaser wavefront analyzer, Hartmann wavefront analyzeriris registrationHartmann wavefront sensor, wavefront aberration, high-resolution wavefront analyzer, wavefront measurement instrument, laser beam and wavefront analyzer, Shack Hartmann, lensMTF

Developed independently by the companyThe wavefront sensor isBased on four wave transverse shear interferometry technology.SID4seriesCompared to traditional Shack Hartmann wavefront detectors, wavefront analyzers havehigh resolutionColor correction, high sensitivityHigh dynamic detection rangeAdvantages such as easy operation. forWavefront aberrationDetection of wavefront distortion and laser beam andwavefrontThe measurement, analysis, and ophthalmic iris localization wavefront aberration guidance provide a new solution!The software interface of the wavefront detector is user-friendly and can intuitively output high-resolution phase maps and beam intensity distribution maps.

High resolution wavefront analyzer/wavefront sensor/wavefront phase difference meter

Wavefront sensor manufacturers haveStrong technical research and development capabilities, able to provide customers with various adaptive optics systemsOA-SYS(Adaptive Optics Loops)，Develop personalized solutions. We can provide customers with the most suitable solutions based on their application needsSID4Wavefront sensors, deformable mirrors, orspatial light modulatorAdaptive optics system operating software, etc.

Figure 1 Comparison before and after wavefront correction

Wavefront detector based on its four wave transverse shearinterfereTechnology has undergone significant upgrades and improvements to Hartmann mask technology.The wavefront sensor will400X300Ultra high resolution and500umThe ultra large dynamic range * is combined together. Can meet the application needs of different customers, and can adjust the intensity, phasePSF(Point spread function)MTF（Modulation transfer function)OTF(Optical Transfer Function)Wavefront aberrationTheM^2Conduct real-time, simple, and fast measurements.

*DepartmentProduct Introduction

SID4 UV-HRHigh resolution ultraviolet wavefront sensor

The company willSID4The wavelength range of wavefront measurement has been extended to190nm-400nm.SID4 UV-HRIt is a high-resolution wavefront sensor suitable for the ultraviolet band, which is very suitable for optical component measurement (such as printing, semiconductor, etc.) and surface detection (semiconductor chip detection, etc.).

Features:

uhigh resolution（250x250）

uLarge aperture for light transmission（8.0mmx8.0mm）

uCovering UV spectra

uhigh sensitivity（0.5um）

uOptimize signal-to-noise ratio

Figure 2 SID4-UV wavefront analyzer

SID4Wavefront sensor

can be used for400nm-1000nm The wavefront phase, intensity distribution, wavefront aberration, and laser'sM2Real time measurement and parameter output of Zenik parameters.

Features:

At the bottomWavelength range:400-1100nm

At the bottomHigh resolution（160x120）

At the bottomachromatic

At the bottomHigh measurement stability

At the bottomNot sensitive to vibration

At the bottomEasy to operate

At the bottomCompact structure and small volume

At the bottomCan be controlled with a laptop computer

Figure 3SID4Phase detection

Can be used to detect various typesLens, optical systemReal time detection of lenses and optical systemsPSF(Point spread function)MTF(Modulation transfer function)OTF(Optics)transfer function）Wavefront aberration measurement and parameter output. Compared to traditional lens detection equipment such as transducers and interferometers, it has the advantages of easy operation, high measurement accuracy, and convenient parameter output, and is increasingly being praised by more and more customers.

Features:

uWavelength range:400-1100nm

uHigh performance camera with high signal-to-noise ratio

uReal time measurement, providing immediate information on the entire surface of the object（120000A measurement point)

uExtremely short exposure time ensures dynamic object measurement

uEasy to operate

Figure 4SID4-HR

image5 SID4-HRTransfer function detection

SID4 NIR Wavefront Sensor

Mainly targeting1550 nm（1.5um-1.6um）Laser detection with high resolutionHigh sensitivityHigh dynamic rangeAdvantages such as easy operation. Can be used for optical measurement,SID4 NIRIt measures the aberrations of infrared objects and infrared lensesPSFTheMTFIdeal tool for focal length and surface quality.

Features:

²High resolution（160x120）

²Quick measurement

²cost-effective

²measurement

²Not sensitive to vibration

image6 SID4 NIRLaser wavefront detection

SID4 DWIRWavefront sensor

Characterized by wideband measurement. Can detect in real-time3-5umand8-14umThe wavefront phase, intensity distribution, and other responsive wavefront information. It can effectively meet the wavefront detection needs of customers in the infrared band.

Features:

uOptical measurement:SID4 DWIRIt is used to measure the characteristics of infrared objects (thermal imaging and safety vision) or infrared lenses（CO2The ideal tool for lasers, with output results includingMTF，PSFAberrations, surface quality, and lens focal length.

uBeam measurement:（CO2Laser, infraredOPOLaser light source, etcSID4 DWIRProvide detailed beam characteristic parameters: aberration,M2Light intensity distribution, beam characteristics, etc

uHigh resolution（96x72）

uCan achieve measurement

uCan cover large numerical aperture measurements in the mid infrared and far-infrared bands without the need for additional intermediate lenses

uQuick measurement is insensitive to vibration

uCan achieve off-axis measurement

ucost-effective

image7SID4 DWIR

SID4Summary of Product Model Parameters

Part 2control software

SID4Wavefront analyzer control software

SID4Wavefront analyzer control softwareAccompanying the SID4 wavefront sensor is a complete analysis software that integrates high-resolution phase and intensity distribution maps to measure light intensity distribution and wavefront information.

with the help ofLabviewandC++Programmable module database (software secondary development toolkit), customers can write various phase measurement and compilation modules according to their own needs.

Adaptive Optics LoopsTranslate into EnglishSID4 Wavefront SensorBased on your application, choose the appropriate deformable mirror or phase modulator to provide a complete set of adaptive optics system. Reducing the phase difference of any optical system is never simple. Our products can provide more reliable and high-precision solutions for laser beams and imaging systems.

image8 SID4control interface

SID4Optical measurement softwareKaleo

Wavefront sensor based on shear interferometry and specially designed optical measurement softwareKaleoCombined, it can measure the aberrations of spherical and non spherical mirrorsMTFWaiting for information. In just a few seconds, our instrument presents you with the vast majority of optical parameters, such as focal length, optical waist,MTFAberration,ZernikeCoefficient, curvature radius,PSFWait.

Part ThreeComparison with traditional Hartmann wavefront analyzer

Comparison with traditional Hartmann wavefront sensor measurement results:

Technical parameter comparison:

Part FourApplication field

At the bottomLaser, astronomy, microscopy, ophthalmology, etcComplex adaptiveWavefront aberration detection in optical systems

At the bottomLaser beam performance, wavefront aberrationM^2Testing of strength, etc

At the bottomInfrared and near-infrared detection

At the bottomcollimator/Detection and installation of telescope system

At the bottomSatellite remote sensing imaging, biological imaging, and thermal imaging fields

At the bottomSpherical and non spherical surfacesOptical component testing(plane,spherical surface,lens)

At the bottomIris localization aberration guidance

At the bottomLarge aperture high-precision optical component testing

At the bottomLaser communication field

At the bottomAerospace field