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Shenzhen Qiushan Trading Co., Ltd
Effective carrier measurement device for silicon wafers used in Japanese PST solar cells
NegotiableUpdate on 01/23
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Overview
The effective carrier measurement device $r $n for silicon wafers used in Japanese PST solar cells is different from traditional conventional products. This product has a miniaturized desktop size of $r $n and can measure wafers at once. Please feel free to contact us at any time for more information.
Product Details
Effective carrier measurement device for silicon wafers used in Japanese PST solar cells
Unlike traditional types of conventional products, this product has
The miniaturized desktop size allows for the measurement of wafers in one go.
Please feel free to contact us for more information.
Unlike traditional types of conventional products, this product has
The miniaturized desktop size allows for the measurement of wafers in one go.
Please feel free to contact us for more information.
The VWECER-100-S device for measuring effective charge carriers on silicon wafers for solar cells uses the new technology "HS-CMR method" developed by the Institute of Metal Materials at Northeastern University to measure the quality of silicon wafers. Due to the ability to accurately determine quality and identify during the silicon wafer stage, it is possible to avoid putting low-quality silicon wafers into battery production lines. As a result, the waste in the battery production process is reduced, making it possible to improve the yield rate.
VWECER-100-S can comprehensively measure all elements related to energy conversion efficiency in silicon wafers (electrons, holes, defects, impurities, etc.), and can accurately measure the number of effective charge carriers that affect power generation with one parameter. The measurement results of VWECER-100-S are directly related to the conversion efficiency when manufacturing silicon wafers into solar cells. The performance of silicon solar cells that cannot be visually confirmed can be measured as' potential conversion efficiency '. Due to the ability to identify and avoid using potentially low conversion efficiency silicon wafers in battery production lines, production costs can be significantly reduced. In addition, by clarifying the effective carrier number inside silicon wafers that could not be accurately measured before, it also helps to improve one of the important technologies in solar cells, the "PN junction technology".
Effective carrier measurement device for silicon wafers used in Japanese PST solar cells
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