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CT-COMPACT nano

NegotiableUpdate on 01/13
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Overview
CT-COMPACT nano 2018/10/11 CT-COMPACT nano, Ultra high resolution can reach sub micron level, and powerful functionality can provide in-situ/4D solutions. Compared with traditional tomography imaging, CT-COMPACT nano has a nanometer resolution that is not limited by sample size and achieves ultra-high resolution of 0.4 μ m. It is suitable for fields such as materials science, semiconductors, petroleum, natural gas, and life sciences. CT-COMPACT nano operates with complex and easily modifiable targets. The combination of unmatched system architecture and typical ProCon X-Ray design provides you with a convenient and efficient system. High quality scanning results are achieved through sub micron resolution and excellent contrast. Features · Easy to operate · Non contact metrology · Interest based scanning · Quality control independent of materials · Defect recognition (cavities, cracks...) · Different reconstruction algorithms filter back projection, algebra, statistics · Multiple scanning trajectories such as Circular, Helix, Planar, etc. · Field of view extension for many scanning trajectories · Hounsfield · Ring artifact suppression and noise reduction algorithm · Beam hardening correction and metal artifact reduction · Shake correction for drift compensation · Phase and dark field contrast options · Matlab/Python/Labview for scripting
Product Details

CT-COMPACT nano, Ultra high resolution can reach sub micron level, and powerful functionality can provide in-situ/4D solutions. Compared with traditional tomography imaging, CT-COMPACT nano has a nanometer resolution that is not limited by sample size and achieves ultra-high resolution of 0.4 μ m. It is suitable for fields such as materials science, semiconductors, petroleum, natural gas, and life sciences.


CT-COMPACT nanoIt operates with complex and easily changeable goals. No matching system architecture and typicalProCon X-RayCombining design provides you with a convenient and efficient system. High quality scanning results are achieved through sub micron resolution and excellent contrast.


features

·Easy to operate

·Non-contact measurement

·Interest level-scan

·Quality control is independent of materials

·Defect identification (voids, cracks)......

·Different reconstruction algorithms filter backprojection, algebra, and statistics

·Multiple scanning trajectoriesCircularHelixPlanarwait a minute

·Expanding the field of view for many scanning trajectories

·Volume scaling(Hounsfield

·Ring artifact suppression and denoising algorithm

·Beam hardening correction and reduction of metal artifacts

·Jitter correction for drift compensation

·Phase and dark field contrast options

·Used for writing scriptsMatlab / Python / Labviewinterface

·Batch processing and scanning plan

·Time resolutionCTScan(4D CT

·In situ option

·Real timeCTrebuild

·UseFlat- panelRapid scanning of detectors<10second

·“Industriepreis 2018-prize winner