3D surface topography measuring instrument

Product Features

3D surface topography measuring instrumentThe weight of S mart is only about half of S neox (6kg), and its compact appearance gives it more options for installation, such as direct installation and analysis in production. Generally speaking, there are factors such as vibration or harmful substance contamination in the production environment that are not suitable for placing measuring instruments. However, S mart has taken these factors into consideration during development, and its integrated design enables it to withstand external pollution or vibration effects.

although3D surface topography measuring instrumentS mart has a smaller volume compared to S neox, but still retains white light interference and phase difference interference Confocal， The four major functions of rapid image generation also use LED light in the light source section. Customers can flexibly choose to use 460nm, 530nm, 630nm or white light bands.

The fusion of confocal and interferometric technologies in Sensofar enables devices to simultaneously measure roughness, 3D morphology, and film thickness. It is precisely because of this technology fusion that the cost-effectiveness of the S mart optical profiler is much higher than other devices of the same type. Smart integrates the functions of microscopic imaging, confocal imaging, confocal contour, phase difference interferometry (PSI), white light interferometry (VSI), and high-resolution thin film thickness measurement. This design based microdisplay technology, with a concise and easy to learn software interface, allows you to quickly and accurately obtain the desired information by simply selecting the right lens, focusing correctly, and choosing the appropriate measurement method.