Electronic products are being developedhigh-temperature agingThere is a need for power on and communication testing from time to time. Some electronic products age under low semi-finished processes, while others age directly as finished products. Most finished products have a relatively simple and convenient wiring method during power on and communication testing, which involves connecting the product's leads or ports. If the aging of semi-finished products requires power on and communication testing, it is more complicated because semi-finished products generally do not have leads and terminals, only reserved wiring holes on the circuit board. Moreover, aging power on and communication cannot damage semi-finished products. Therefore, these semi-finished products need to be designed with an aging test bench that can quickly connect power and communication.

Aging test benchIt is mainly composed of the main housing, quick press, needle plate, needle tube, lead wire, switch, etc.

LED aging test benchThe main housing is made of orange electric wood, which is a solid plastic that is heat-resistant, not easily aged, and has high mechanical strength and corrosion resistance. Standardized design and processing, replacing the corresponding pin board and carrier board for different circuit boards, without the need to replace the entire testing bench.

The fast compactor is a standard product on the market, which can be replaced and changed. During aging testing, simply press the handle to power on the circuit board, which is convenient and fast, saving operation time.

The needle tubes of the aging test bench are mainly made of phosphor copper tubes plated with gold; Spring: stainless steel wire; Needle: phosphor copper (nickel plated). According to the different semi-finished products, different needle tubes are used. (Often as shown in Figure 3)

Accuracy of aging test bench test version: dimensional tolerance can reach ± 0.01MM; one-time processing concentricity ⊙ 0.005mm; one-time processing parallelism ∥ 0.01MM; unilateral perpendicularity ⊥ 0.01MM.