- Phone
-
Address
Room 707, Aiqian Building, 599 Lingling Road, Xuhui District, Shanghai, China
Product Categories
- ALL
- GGB microwave probe
- Quantifoil porous mesh carrier
- GGB calibration standard sample
- Customized vibration isolation system
- Ion beam etching/deposition system
- Silicon nitride thin film window
- AFM substrate
- MPI RF calibration substrate
- AFM probe
- GGB active high impedance needle tip
- GGB DC probe
- Hole shaped template
- Duramin-40 hardness tester
- Prism coupler
- 4-inch nanoimprint machine NIL-100
- Leica room temperature ultra-thin slicer Leica EM UC7
- Film thickness measuring instrument
- BI-2500 desktop surface plasmon resonance analyzer
- TS150-HP high-power probe station
- Established Active Vibration Isolation Platform
- BI-4500 high-throughput fully automatic surface plasmon resonance analyzer
- MVI scattering scanning near-field optical microscope
- Scanwave Scanning Microwave Near Field Impedance Microscope
- TS150 6-inch manual probe station
- 4200A-SCS parameter analyzer
- Zeta20 multi-mode 3D optical profilometer
- F40 Microscopic Film Thickness Measuring Instrument
- Z-series stereomicroscope Leica Z6 APO
- F30 online film thickness tester
- F60 Fully Automatic Film Thickness Tester
- Vista-IR High Resolution Nanoinfrared Imaging and Spectroscopy System
- Diener NANO plasma cleaning machine
- 6-inch nanoimprint machine NIL-150
- LF-2000 Integrated In Situ Nanomanipulation Machine
- Passive isolation table GWA-TM
- High precision nano stretching system Nano UTM T150
- RSA5000 series spectrum analyzer
- TTR500 Series Vector Network Analyzer (VNA)
- MTA02 Micro Force Displacement Test Control System
- PA1000 power analyzer
- TS2000 automatic probe station
- TS200 8-inch manual probe station
- Candela CS920 Surface Defect Detector
- F3 Single Point Film Thickness Tester
- NX Hivac High Vacuum Atomic Force Microscope
- P170 fully automatic wafer probe profilometer/stair step meter
- NX-PTR fully automatic online detection atomic force microscope
- P17 automatic wafer probe profilometer/stair step meter
- NX-HDM fully automatic defect detection atomic force microscope
- NX Wafer Fully Automated Wafer Inspection Atomic Force Microscope
Shanghai Nateng Instrument Co., Ltd
