Quanta SEM

The FEI Quanta series includes six variable pressure and environmental scanning electron microscopes (ESEM). All of these products can meet various sample and imaging requirements for industrial process control laboratories, materials science laboratories, and life science laboratories.

The Quanta series scanning electron microscope is a multifunctional and high-performance instrument, with three modes: high vacuum, low vacuum, and ESEM. It can handle a wide range of sample types, making it the most versatile SEM system. All of themQuanta SEMAll systems can be equipped with analysis systems, such as energy dispersive spectrometers, X-ray wavelength dispersive spectrometers, and electron backscatter diffraction systems. In addition, the field emission electron gun (FEG) system includes an S/TEM detector for imaging bright and dark field samples. Another variable configuration in the SEM system is the size of the electric worktable (divided into three types: 50mm, 100mm, and 150mm) and the size of the electric Z-axis stroke (25mm, 60mm, and 65mm, respectively). Quanta 650 and 650 FEG are both designed with large specimen chambers, capable of analyzing and browsing large specimens.

Quanta's Materials Science Applications

With the launch of the Quanta 50 series, the currentQuanta SEMThe series is more flexible. For materials science, these new instruments can meet the needs of studying numerous types of materials and characterizing their structures and compositions. FEI Quanta ™ The 50 series is highly flexible and versatile, capable of addressing the challenges of many research fields today. Observing any sample and obtaining all data - surface and composition images can be combined with accessories to determine material properties and elemental composition.