NanoTR/PicoTR pulse laser thermal reflection thermal conductivity meter from Nike

NegotiableUpdate on 01/22

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

NanoTR/PicoTR pulse laser thermal reflection thermal conductivity analyzer, Hubei Anhe Instrument Co., Ltd., is a sales agent of Germany's NanoTR in central China. Its main products include thermogravimetric analyzer, differential scanning calorimeter, synchronous thermal analyzer, thermomechanical analyzer, dynamic thermomechanical analyzer, high force and high temperature dynamic thermomechanical analyzer, dielectric resin curing monitoring instrument, thermal property measurement instrument series, adiabatic acceleration calorimeter series and other German NanoTR products

Product Details

NanoTR/PicoTR pulse laser thermal reflection thermal conductivity meter from NikeHubei Anhe Instrument Co., Ltd. is the sales agent of Germany's Naichi in Central China. Our main products include: thermogravimetric analyzer, differential scanning calorimeter, synchronous thermal analyzer, thermo mechanical analyzer, dynamic thermo mechanical analyzer, high force value and high temperature dynamic thermo mechanical analyzer, dielectric resin curing monitoring instrument, thermal property measurement instrument series, adiabatic acceleration calorimeter series and other German Naichi products.

Product Usage

The thermal reflection method is based on an ultra high speed laser flash system, which can measure the thermal properties of metal, ceramic, and polymer thin films on the substrate, such as thermal diffusion coefficient, thermal conductivity, heat absorption coefficient, and interface thermal resistance. This system can measure thin films with thicknesses as low as 10nm. At the same time, the system provides different measurement modes to adapt to different substrate conditions (transparent/opaque).

Product performance:

Due to the fact that the laser flash time is only in the nanosecond (ns) range, and can even reach the picosecond (ps) range, this system can measure thin films with thicknesses as low as 10nm.
The system provides different measurement modes to adapt to different substrate conditions (transparent/opaque).
RF measurement mode: The main laser source heats the film from the back, detects the temperature rise process of the film measured by the laser from the front, and calculates the thermal conductivity parameters of the film. This mode is applicable to transparent substrates.
FF measurement mode: The main laser source heats the film from the front, detects the temperature drop process of the film measured by the laser from the front, and calculates the thermal conductivity parameters of the film. This mode is suitable for opaque substrates.
This method complies with the standard:
JIS R 1689: Measurement of thermal diffusivity of fine ceramic films by pulsed laser thermal reflection method;
JIS R 1690: Measurement Method for Interface Thermal Resistance between Ceramic Thin Films and Metal Thin Films.

Product parameters:

Brief History of Development:

In 1990, the Japan Institute of Industrial Technology (AIST/NMIJ) invented the heat reflection method to measure the thermal conductivity of thin films.
In 2008, AIST established PicoTherm company.
In 2010, PicoTherm launched the NanoTR nanosecond thermal reflection system.
In 2012, PicoTherm launched PicoTR, a picosecond level thermal reflection system.
In 2014, PicoTherm and NETZSCH established a strategic partnership. NETZSCH is responsible for the sales and service of PicoTherm products.

Introduction

Technical Background

Measurement Mode

Instrument model

Technical Specifications

Software features

test instance

Sample testing service

		NanoTR	PicoTR
host	temperature range 真空度 Measurement Mode	RT, RT... 300 ° C (optional) N/A RF/FF	RT, RT... 500 ° C (optional) 10-6 mbar (optional) RF/FF
measurement items		Thermal diffusivity coefficient, heat absorption coefficient, interface thermal resistance
Heating laser	pulse width wavelength spot diameter	1 ns 1550 nm 100 μm	0.5 ps 1550 nm 45 μm
Detecting laser	pulse width wavelength spot diameter	continuous 785 nm 50 μm	0.5 ps 775 nm 25 μm
Sample thin layer thickness (RF mode)	resin ceramics metal	30 nm . .. 2 μm 300 nm . .. 5 μm 1 μm . .. 20 μm	10 nm . .. 100 nm 10 nm . .. 300 nm 100 nm . .. 900 nm
Sample thin layer thickness (FF mode)		> 1 μm	> 100 nm
matrix	material size thickness	Opaque/Transparent 10... 20mm square ≤ 1 mm
Thermal diffusion time		10ns . .. 10µs	10ps . .. 10ns
thermal diffusivity	scope accuracy repetitiveness	0.01 . .. 1000 mm²/s CRM 5808A, 400nm thickness, RF mode, 40min test time verification: ± 6.2%

NanoTR/PicoTR pulse laser thermal reflection thermal conductivity meter from NikeHubei Anhe Instrument Co., Ltd. is the sales agent of Germany's Naichi in Central China. Our main products include: thermogravimetric analyzer, differential scanning calorimeter, synchronous thermal analyzer, thermomechanical analyzer, dynamic thermomechanical analyzer, high force value and high temperature dynamic thermomechanical analyzer, dielectric resin curing monitor, thermal property measurement instrument series, adiabatic acceleration calorimeter series and other German Naichi products