Dongguan Kedi Instrument DJH-E Electrolytic Thickness Gauge

Dongguan Kedi Instrument DJH-E Electrolytic Thickness Gauge

Product Introduction:The application fields of DJH-E electrolytic thickness gauge include automobiles, motorcycles, bicycles, aerospace and navigation, electronic appliances, circuit boards, hardware locks, sanitary ware, plastic electroplating, standard parts, neodymium iron boron, technical supervision departments and scientific research institutions.

DJH-E Intelligent Electrolytic Thickness Gauge - Professional Seller of Kodi Instruments! Strong strength!

Technical characteristics of DJH-E intelligent electrolytic thickness gauge:
Measurement method: anodic dissolution coulomb method, in accordance with ISO2177 standard
Measurement principle: Designed using Faraday's principle, the process is similar to electroplating, but the direction of the electrochemical reaction is opposite, which is electrolytic plating. Coulombic method for thickness measurement is the process of locally anodic dissolution of the metal coating on the tested part. The thickness of the coating is measured by the potential change and required time when the anodic dissolution coating reaches the substrate

Measuring substrates: metal, plastic, and other substrates

Measurement of coatings: chromium, nickel, copper, zinc, tin, silver, gold, cadmium and other metal coatings, nickel alloy coatings, composite coatings (such as Cr/Ni/Cu)

Measurement range: 0-35 μ m

Resolution: Gold, Decorative Chromium: 0.01 μ m, Other Coatings: 0.1 μ m

Uncertainty: ≤± 10%

Measurement size: Standard type 2100B: Small workpiece size of 2.5mm (5mm2) or diameter of 6mm or above; Smaller 2100S: Small workpieces with a diameter of 2mm (3mm2) or larger than 2.5mm

Power supply: AC 220V ± 10%, 50/60Hz, 30W

Net size of the host: 210 (W) × 360 (D) × 85 (H) mm

Dongguan Kedi Instrument DJH-E electrolytic thickness gauge,Note: DJH-E is an improved version of DJH-D, equipped with a micro printer that can automatically print plating, thickness, and testing time.